In the world of electronics manufacturing, regulations change frequently – it’s something both manufacturers and test labs know to be part and parcel with the industry. However, the significant changes between ETSI’s V1.7.1 and V1.8.1 have proven more difficult to adapt to with speed and dexterity. Savvy manufacturers and labs alike are now wondering: “what’s coming with ETSI EN 300 328 beyond V1.8.1? How can I anticipate these changes?” Here are four things that we already know about V1.8.2 – and beyond.
ETSI EN 300 328 V1.8.2: Coming In 2015
The draft version of v.1.8.2 was released in April of this year, and the final harmonized standard is expected to be published next year as V1.9.1. There are several changes included in V1.8.2 that should reduce some of the misunderstandings and confusion that we’ve seen with V1.8.1.
The overall scope and the essential requirements of the standard remain the same, however there are changes that include new and revised definitions, modifications to the limits, and simplification and clarification of test methods.
- New Definition Of Dwell Time
For frequency hopping equipment, the definition of Dwell Time was clarified in V1.8.2. Based on this clarification, the conformance requirement for Dwell Time was renamed to Accumulated Transmit Time. There was some confusion regarding the definition and the limit, mainly because V1.8.1 makes it seem like the limit is applied to the Accumulated Channel Dwell Time, and not to the accumulated Channel Transmit Time.
- Frequency Occupation: Two Options For Compliance
Also for frequency hoppers, the requirement for Minimum Frequency Occupation was renamed to Frequency Occupation, and it now includes two options for compliance, one being an occupation probability. With that, the manufacturer will use statistical analysis to confirm conformance with both Accumulated Transmit Time and Frequency Occupation. This only applies in certain circumstances, however. An example of this: you cannot measure your idle or your receive periods during the hop sequence.
- Modified: Adaptivity For Non-FHSS Devices
The Adaptivity conformance requirement for non-frequency hopping devices using Listen Before Talk (LBT) was also modified to remove the random variable ‘R’ and the value ‘q’. These variables are used for calculating the extended Clear Channel Assessment (CCA) time and the Channel Occupancy time, and were very confusing. So instead of using ‘R’ and ‘q’, the CCA time and Channel Occupancy time in V1.8.2 are fixed values, or a range of fixed values to simplify the test methods.
- Transmitter Unwanted Emissions And Receiver Spurious Emissions
The transmitter unwanted emissions in the spurious domain and the receiver spurious emission requirements have also changed in V1.8.2. V1.8.2 includes a clarification on the requirement for both conductive and radiated measurements. V1.7.1 as well as other harmonized standards include a requirement that spurious emissions be measured at the antenna port and from the equipment cabinet, or from the equipment with the antenna attached. But for some reason, this was not included in V1.8.1, so it was added back in the new version.
The test procedures for spurious emissions were also modified and slightly better defined in the draft of V1.8.2. The number of sweep points was increased and the standard also specifies use of a spectrum analyzer filter of 3dB (Gaussian). The test procedure will require a zero span video triggered measurement for the time domain power for each spurious emission, whereas previously this was just a simple narrow band measurement.
ETSI EN 300 328 V1.10.1
There are other changes in V1.8.2, but they are too numerous to detail. All of these changes were put into place to help clarify some of the conformance requirements and test methods, and hopefully eliminate some of the questions and confusion already seen with V1.8.1. EN 300 328 V1.10.1 is already on the horizon; a task group has already been commissioned to work on this standard. We don’t know much about the expected content of V1.10.1, but it’s safe to assume that it will provide more clarification, and possibly even newer test methods. Stay tuned.